Probe Unit


Introduction

Test unit for checking problems when an LCD panel is turned on


Features

  • Significant implementation of visual inspection
  • Full Contact(COF)
  • Variable pitch
  • Apply COF/COG
  • Own patent registration
  • Pin structure : easy to repair
  • Pitch range : ≤ 15um


Specification

BLADE
( 2nd Generation )
COF(I.C)
( 3rd Generation )
MEMS FILM
( 4th Generation )
PAD ITO, IZO ITO, IZO ITO, IZO
Min. Pin Width 15㎛ (Be-Cu, Be-Ni) - 6㎛
Min. Pitch 20㎛ 30㎛ 15㎛
Delivery
New / Repeat
3wk/2wk 2wk/1.5wk 2wk/1.5wk
Pad Damage Y N N
Block Image